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STW21NM60NN-Channel 600 V 17A (Tc) 140W (Tc) Through Hole TO-247-3

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ABRmicro #.ABR2045-STW21N-1018485
ManufacturerSTMicroelectronics
MPN #.STW21NM60N
Estimated Lead Time-
SampleGet Free Sample
DatasheetDatasheetSTx21NM60N(-1)(PDF)
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In Stock: 10
Shipped From Shenzhen or Hong Kong Warehouses
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Tube
Shipping DateNovember 16, 2024
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Technical Specifications
SeriesMDmesh™
Packaging
Tube
Lifecycle StatusObsolete
Base Product NumberSTW21N
Continuous Drain Current (ID) @ 25°C17A (Tc)
Drain-to-Source Voltage (VDS)600 V
Drain-to-Source On Resistance (Max. Min.Rᴅs(on))10V
FET Feature-
FET TypeN-Channel
Gate Charge Total (Qg)(Max.)66 nC @ 10 V
Common Source Input Capacitance (Cɪss)(Max.)@(Vᴅs)1900 pF @ 50 V
MfrSTMicroelectronics
Mounting StyleThrough Hole
Operating Temperature150°C (TJ)
Maximum Power Dissipation140W (Tc)
RDS(on) Drain-to-Source On Resistance220mOhm @ 8.5A, 10V
Package Type (Mfr.)TO-247-3
TechnologyMOSFET (Metal Oxide)
Gate-to-Source Voltage (Vɢs)±25V
VGS(th) Gate-to-Source Threshold Voltage (Max.)4V @ 250µA
Package / CaseTO-247-3
Customize Part Specifications , or Contact Our Sales Representative to Obtain the Data You Desireinfo@Abrmicro.com
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Datasheets
STx21NM60N(-1)
Environmental & Export Classifications
RoHS ComplianceComplies with RoHS 3 Directive (2015/863/EU)
MSL Level1 (Unlimited, ≤ 30°C/85% RH), No special packaging
REACH RegulationNo SVHCs Present
US ECCNEAR99
HTSUS8541.29.0095 (Other; No import duty applies)
Additional Details
The STW21NM60N is a versatile N-Channel MOSFET manufactured by STMicroelectronics, featuring a voltage rating of 600 V and a current capacity of 17A at Tc conditions. It is designed for high power efficiency with a power dissipation of 140W also at Tc. Encased in a TO-247-3 package, this MOSFET caters to through-hole mounting requirements. With a gate-to-source voltage of ±25V and a gate charge of 66 nC at 10 V, it presents reliable switching characteristics for demanding electrical applications.
This information is sourced from the Internet, hasn't been reviewed, and may contain errors.