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74LVC1G80GX,125Flip Flop 1 Element D-Type 1 Bit Positive Edge 4-XFDFN Exposed Pad

1:$0.3670

Orders Over $2000 Receive a $100 Discount for Registered Abrmicro Users.
ABRmicro #.ABR2019-74LVC1-915476
ManufacturerNexperia USA Inc.
MPN #.74LVC1G80GX,125
Estimated Lead Time6 Weeks
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In Stock: 6988
Shipped From Shenzhen or Hong Kong Warehouses
Min.&Mult.1
Packaging
Tape & Reel (TR)Cut Tape (CT)Abrmicro® Custom Packaging
Shipping DateNovember 3, 2024
* Quantity
Unit Price$ 0.3670
Ext. Price$ 0.3670
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* Prices exclude tax, and all prices are in USD.
Price Gradients
Qty.Unit PriceExt. Price
1$0.3670$0.3670
10$0.2740$2.7400
25$0.2470$6.1750
100$0.1710$17.1000
250$0.1430$35.7500
500$0.1160$58.0000
1000$0.0900$90.0000
2500$0.0800$200.0000
5000$0.0760$380.0000
* Prices are for reference only and are subject to change. Final sales prices will be confirmed at the time of purchase.
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Technical Specifications
Series74LVC
Packaging
Tape & Reel (TR)
Cut Tape (CT)
Abrmicro® Custom Packaging
Lifecycle StatusActive
Base Product Number74LVC1G80
Clock Frequency400 MHz
Output Current (High, Low)32mA, 32mA
Current - Quiescent (Iq)200 µA
FunctionStandard
Input Capacitance5 pF
Propagation Delay (Max.)@ (Vᴄᴄ)(ᴄʟ)4.5ns @ 5V, 50pF
Mounting StyleSurface Mount
Number of Bits per Element1
Number of Elements1
Operating Temperature-40°C ~ 125°C (TA)
Output TypeInverted
Package Type (Mfr.)5-X2SON (0.80x0.80)
Trigger TypePositive Edge
TypeD-Type
Supply Voltage1.65V ~ 5.5V
Package / Case4-XFDFN Exposed Pad
Customize Part Specifications , or Contact Our Sales Representative to Obtain the Data You Desireinfo@Abrmicro.com
Environmental & Export Classifications
RoHS ComplianceComplies with RoHS 3 Directive (2015/863/EU)
MSL Level1 (Unlimited, ≤ 30°C/85% RH), No special packaging
REACH RegulationNo SVHCs Present
US ECCNEAR99
HTSUS8542.39.0060 (Other; No import duty applies)
Quality Inspection Records
The 74LVC1G80GX,125 (IC FF D-TYPE SNGL 1BIT 5X2SON) passed the burn-in testing upon entering the Abrmicro warehouse on November 9, 2023, verifying its reliability under high temperatures and stresses for extended periods without detecting potential early failures.
Abrmicro Laboratory