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S30S2T0D24ZCurrent Sensor 2000A 1 Channel Hall Effect, Closed Loop Bidirectional Module, Single Pass Through
1:$230.6740
Orders Over $2000 Receive a $100 Discount for Registered Abrmicro Users.
ABRmicro #.ABR525-S30S2T-2237312
ManufacturerTamura
MPN #.S30S2T0D24Z
Estimated Lead Time26 Weeks
SampleGet Free Sample
DatasheetS30S D24 Series(PDF)
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In Stock: 8
Shipped From Shenzhen or Hong Kong Warehouses
Min.&Mult.1
Packaging
Tray
Shipping DateNovember 3, 2024
* Quantity
Unit Price$ 230.6740
Ext. Price$ 230.6740
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* Prices exclude tax, and all prices are in USD.
Price Gradients
Qty.Unit PriceExt. Price
1$230.6740$230.6740
5$194.6000$973.0000
10$180.8690$1808.6900
25$164.2010$4105.0250
40$160.9590$6438.3600
* Prices are for reference only and are subject to change. Final sales prices will be confirmed at the time of purchase.
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Current Sensor 2500A 1 Channel Hall Effect, Open Loop Bidirectional Module, Single Pass Through Technical Specifications
SeriesS30S D24
Packaging
Tray
Lifecycle StatusActive
Accuracy±0.3%
Current - Sensing2000A
Supply Current (Max.)45mA
For MeasuringAC/DC
FrequencyDC ~ 150kHz
Linearity±0.1%
MfrTamura
Mounting StyleChassis Mount
Number of Channels1
Operating Temperature-40°C ~ 85°C
OutputRatiometric, Current
PolarizationBidirectional
Response Time500ns
Sensitivity-
Sensor TypeHall Effect, Closed Loop
Supply Voltage±15V ~ 24V
Package / CaseModule, Single Pass Through
Customize Part Specifications , or Contact Our Sales Representative to Obtain the Data You Desireinfo@Abrmicro.com
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Datasheets
PCN Assembly/Origin
Environmental & Export Classifications
RoHS ComplianceComplies with RoHS 3 Directive (2015/863/EU)
MSL LevelNot Required
US ECCNEAR99
HTSUS9030.33.3800 (Other; Unit of Quantity [No.]; General duty rate 'FREE'; Non-NTR country duty rate '40%')
Quality Inspection Records
The S30S2T0D24Z (CURRENT SENSOR (2000A; 24V; 5000) passed the junction temperature testing upon entering the Abrmicro warehouse on December 10, 2023, confirming that the maximum junction temperature of the IC remains within safe operational limits under high load conditions.
Abrmicro Laboratory