L40S1T0D15JCurrent Sensor 1000A 1 Channel Hall Effect, Open Loop Bidirectional Module
1:$43.3140
Orders Over $2000 Receive a $100 Discount for Registered Abrmicro Users.
ABRmicro #.ABR525-L40S1T-2305625
ManufacturerTamura
MPN #.L40S1T0D15J
Estimated Lead Time26 Weeks
SampleGet Free Sample
Datasheet
L40S D15 Series Datasheet(PDF)
L40S D15 Series Datasheet(PDF)
For large-volume purchases, our unique channels enable us to provide prices that other suppliers cannot match: significantly below market rates.
Service
Guaranteed AuthenticityTechnical SupportFast RefundFree Shipping (over $960)Issue an Invoice24/7 Manual Service In Stock: 21
Shipped From Shenzhen or Hong Kong Warehouses
Min.&Mult.1
Packaging
Tray
Shipping DateNovember 3, 2024
* Quantity
Unit Price$ 43.3140
Ext. Price$ 43.3140
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* Prices exclude tax, and all prices are in USD.
Price Gradients
Qty.Unit PriceExt. Price
1$43.3140$43.3140
10$36.4720$364.7200
30$34.1920$1025.7600
90$33.0520$2974.6800
* Prices are for reference only and are subject to change. Final sales prices will be confirmed at the time of purchase.
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Technical Specifications
SeriesL40S D15
Packaging
Tray
Lifecycle StatusActive
Accuracy-
Current - Sensing1000A
Supply Current (Max.)25mA
For MeasuringAC/DC
FrequencyDC ~ 25kHz
Linearity±0.1%
MfrTamura
Mounting StyleChassis Mount
Number of Channels1
Operating Temperature-40°C ~ 105°C
OutputRatiometric, Voltage
PolarizationBidirectional
Response Time5µs
Sensitivity-
Sensor TypeHall Effect, Open Loop
Supply Voltage±12V ~ 15V
Package / CaseModule
Customize Part Specifications , or Contact Our Sales Representative to Obtain the Data You Desire
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info@Abrmicro.comExtended Links
Datasheets
Environmental & Export Classifications
RoHS ComplianceComplies with RoHS 3 Directive (2015/863/EU)
MSL LevelNot Required
US ECCNEAR99
HTSUS9030.33.3800 (Other; Unit of Quantity [No.]; General duty rate 'FREE'; Non-NTR country duty rate '40%')
Quality Inspection Records
The L40S1T0D15J (CURRENT SENSOR (1000A; 15V) -40) passed the decapsulation and die inspection upon entering the Abrmicro warehouse on March 28, 2024. Decapsulation is a destructive test that physically opens the IC to inspect the die and internal structure for manufacturing defects or failure modes. The results showed no defects.
Abrmicro Laboratory